28.06.2012

Image processing improves quality of solar wafers

Special lighting by Vision & Control GmbH in combination with unique algorithms makes even the smallest wafer faults visible. This not only improves the quality of the wafer, but reduces the cost of subsequent work.

Figure 1 Figure 2 Figure 3

Figure 1: Dark field configuration

In dark field configurations (Figure 1), minimal surface faults are visible. The configuration of lighting and cameras reflects the light in such a way that no light falls on the sensor when the wafer is flawless. Faults, on the other hand, are shown as light areas on the screen. Faults within the camera's resolution limit can thus be reliably detected.

Figure 2: Bright field configuration

In bright field configuration, light is reflected in such a way that it hits the camera when the wafer is flawless. Ridges on wafers are shown as shadows.

You can obtain further information from our partner Buchanan Systems.